http://www.physik.hu-berlin.de/en/sem

Berlin

The Berlin-Adlershof Center for Advanced Microscopy (BeAM) is a collaboration by Humboldt-Universität zu Berlin (HU), Helmholtz-Zentrum Berlin for Materials and Energy (HZB), and the Fritz Haber Institute of the Max Planck Society (FHI) under the roof of the Center for the Science of Materials Berlin (CSMB) of HU.

BeAM offers a wide variety of state-of-the-art materials characterization techniques at the nanoscale. The different (scanning) transmission electron microscopes and scanning electron microscopes complement one another in covering a wide range of spatial resolutions in imaging and spectroscopic or diffraction mapping ranging from a few nm to sub-Angstrom, temporal resolution for in-situ and pump-probe experiments in the femtosecond regime, and spectral sensitivity ranging from elemental mapping to mapping of phonons and electronic structure. The range of microscopic techniques is further complemented by a number of different specimen preparation and advanced data analysis techniques to make sure that the whole workflow from sample to data has no weak links.